BRIEFSMulti-Year Agreement • June 24th, 2008
Contract Type FiledJune 24th, 2008A powerful new capability for high-resolution nanoscale material property mapping has reportedly been developed by Veeco Instruments Inc., Plainview, N.Y. The HarmoniX Atomic Force Microscope (AFM) provides the ability to simul- taneously capture quantitative maps of material properties such as elasticity, adhesion, dissipa- tion, and peak force. The technique renders the highest resolution at acquisition rates 250 times faster than conventional methods.