Test Steps. Figure 6-36 Receiver sensitivity test a Connect the test system according to Figure 6-36. XXXX based on the characteristics of the optical module. Use the test pattern defined in Table 6-2. c When for a multi-lane optical module, ensure that each optical lane is tested individually by connecting to an external wavelength demultiplexer and all other lanes are in operation using the same test pattern. d Measure the optical power values of the two output ports of the splitter to P1 and P2 defined in Figure 6-36, and determine the optical power compensation value using the following equation: ΔP = P2 – P1. Then the receive optical power(P2) of the DUT can be calculated as P2=P1+ΔP. e Adjust the optical attenuator to 0 dB and wait for a time interval. After confirming the phase lock of the XXXX, wait until the BER is stable. Then record the BER after 3 seconds. Note: Calculate the time interval of error bits accumulation when the is BER tested based on confidence (95%), BER (2.4E-4), and the following equation: Equation 6-16: CL = 1 − e−Nbits×BER Where: CL: confidence Nbits: bits accumulation that the pattern generator sends in the time interval. BER: bit error ratio. The time interval of error bits accumulation is 2.35E-7s when CL is 95% and the BER is 2.4E-4. The test duration is 3 seconds. f Adjust the attenuation value of the VOA until the measured BER is around BER 1E-6. Note: The step of adjusting the attenuation value is advised to be set at 0.5dB. g Adjust the attenuation value of the VOA until the measured BER rests stably 2.4E-4. Note: The step of adjusting the attenuation value is advised to be set at 0.1dB. h The above receive optical power and the corresponding BER are drawn as a BER curve, according to which the received optical power corresponding to the target BER is obtained, namely, the ‘receiver sensitivity’. i When for a multi-lane optical module, repeat the test for other lanes. Note: The SECQ of the Reference transmitter's optical eye is 0.9 dB (an ideal input signal without overshoot). The test signal should have negligible impairments such as inter-symbol interference (ISI), rise/fall times, jitter and RIN.
Test Steps. DUT TX Figure 6-1 Signal rate test a Connect the test system according to Figure 6-1. b Set the output service rate, modulation format, amplitude, test pattern and other parameters for the XXXX based on the characteristics of the optical module. Use the test pattern defined in Table 6-2. Note: The amplitude for the XXXX is advised to be set at 600mV.
Test Steps. b XXXX cannot be directly connected to the module a Connect the test system according to Figure 6-2. b Set the output service rate, modulation format, amplitude, test pattern, output frequency offset and other parameters for the XXXX based on the characteristics of the optical module. Use the test pattern defined in Table 6-2. Note: • The amplitude for the XXXX is advised to be set at 600mV. • Output frequency offset is advised to select six test points: –100 ppm, –60 ppm, –20 ppm, +20 ppm, +60 ppm, and +100 ppm. • The frequency offset adjustment rate is advised to be set at 5 ppm/s, 20 ppm/s, 50 ppm/s, and 100 ppm/s. c Check whether the BER of the DUT meets the requirement and read the packet loss rate, and alarm information about the DUT on XXXX.
Test Steps. Figure 6-4 Center wavelength test a Connect the test system according to Figure 6-4. b Set the output service rate, modulation format, amplitude, test pattern and other parameters for the XXXX based on the characteristics of the optical module. Use the test pattern defined in Table 6-2. Note: The amplitude for the XXXX is advised to be set at 600mV.
Test Steps. Figure 6-6 SMSR test a Connect the test system according to Figure 6-6. XXXX based on the characteristics of the optical module. Use the test pattern defined in Table 6-2. c Ensure that each optical lane is tested individually by connecting to an external wavelength demultiplexer. And for a multi-lane optical module, all other lanes are in operation using the same test pattern. d Read the ‘SMSR’ of the DUT on OSA. Note: • Set the OSA to work in vacuum mode before reading the result. • The wavelength scanning range of the OSA is advised to be set at 20 nm, and the wavelength scanning accuracy is advised to be set at 0.02 nm. f When for a multi-lane optical module, repeat the test for other lanes.
Test Steps. Figure 6-8 RMS spectral width test a Connect the test system according to Figure 6-8. XXXX based on the characteristics of the optical module. Use the test pattern defined in Table 6-2. c When for a multi-lane optical module, ensure that each optical lane is tested individually by connecting to an external wavelength demultiplexer and all other lanes are in operation using the same test pattern.
Test Steps. Figure 6-9 Average launch optical power test a Connect the test system according to Figure 6-9. XXXX based on the characteristics of the optical module. Use the test pattern defined in Table 6-2. c When for a multi-lane optical module, ensure that each optical lane is tested individually by connecting to an external wavelength demultiplexer and all other lanes are in operation using the same test pattern. d Read the ‘average optical power’ on the Optical power meter. e When for a multi-lane optical module, repeat the test for other lanes.
Test Steps a Record the ‘average optical power’ value of each lane by referencing to 6.7. b Record the ‘extinction ratio’ value of each lane by referencing to 6.14. c Calculate the ‘OMAouter’ according to Equation 6-6.
Test Steps a Record the ‘OMAouter’ value of each lane by referencing 6.8. b Record the ‘TDECQ’ value of each lane by referencing 6.10. c Calculate the ‘launch power in OMA minus TDECQ, each lane (Min)’ according to 6.9.1.
Test Steps a Connect the test system according to Figure 6-11. Other equivalent measurement implementations may be used with suitable calibration. XXXX based on the characteristics of the optical module. Use the test pattern defined in Table 6-2. c When for a multi-lane optical module, ensure that each optical lane is tested individually by connecting to an external wavelength demultiplexer and all other lanes are in operation using the same test pattern.
