Basic gate propagation delay time. (3) means the propagation delay time value corresponding to the basic gate used in a "monolithic integrated circuit". For a 'family' of "monolithic integrated circuits", this may be specified either as the propagation delay time per typical gate within the given 'family' or as the typical propagation delay time per gate within the given 'family'.
Basic gate propagation delay time. (Category 3) means the propagation delay time value corresponding to the basic gate used in a “monolithic integrated circuit”. For a ‘family’ of “monolithic integrated circuits”, this may be specified either as the propagation delay time per typical gate within the given ‘family’ or as the typical propagation delay time per gate within the given ‘family’; Note 1“Basic gate propagation delay time” is not to be confused with the input or output delay time of a complex “monolithic integrated circuit”. Note 2‘Family’ consists of all integrated circuits to which all of the following are applied as their manufacturing methodology and specifications except their respective functions: a. The common hardware and software architecture; b. The common design and process technology; and c. The common basic characteristics. “bias” (accelerometer) (Category 7) means the average over a specified time of accelerometer output, measured at specified operating conditions, that has no correlation with input acceleration or rotation. “Bias” (accelerometer) is expressed in g or in metres per second squared (g or m/s2). (Ref. IEEE Std 528-2001) (Micro g equals 1 × 10-6 g); “bias” (gyro) (Category 7) means the average over a specified time of gyro output, measured at specified operating conditions, that has no correlation with input rotation or acceleration. “Bias” (gyro) is typically expressed in degrees per hour (degrees/hr). (Ref. IEEE Std 528-2001); “biological agents” (Category 1) means pathogens or toxins, selected or modified (such as altering the purity, shelf life, virulence, dissemination characteristics, or resistance to UV radiation) to produce casualties in humans or animals, degrade equipment or damage crops or the environment; “camming” (Category 2) means axial displacement in one revolution of the main spindle measured in a plane perpendicular to the spindle faceplate, at a point next to the circumference of the spindle faceplate (Ref. ISO 230-1:1986, paragraph 5.63); “CEP” (Category 7) means “Circular Error Probable” — In a circular normal distribution, the radius of the circle containing 50% of the individual measurements being made, or the radius of the circle withinwhich there is a 50% probability of being located;
Basic gate propagation delay time. (3) means the propagation delay time value corresponding to the basic gate used in a «monolithic integrated circuit». For a «family» of
More Definitions of Basic gate propagation delay time
Basic gate propagation delay time. (3) means the propagation delay time value corresponding to the basic gate used in a "monolithic integrated circuit". For a 'family' of "monolithic integrated circuits", this may be specified either as the propagation