Description of Goniometer Sample Clauses

Description of Goniometer. A goniometer which can be used in making retro-reflection measurements in the CIE geometry is illustrated in Annex 1, figure 2. In this illustration, the photometer head is arbitrarily shown to be vertically above the source. The first axis is shown to be fixed and horizontal and is situated perpendicular to the observation half-plane. Any arrangement of the components which is equivalent to the one shown can be used.
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Description of Goniometer. A goniometer as defined in paragraph 2.4. of this Regulation, which can be used in making retro-reflection measurements in the CIE geometry is illustrated in Figure A4-V. In this illustration, the photometer head (O) is arbitrarily shown to be vertically above the source (I). The first axis is shown to be fixed and horizontal and is situated perpendicular to the observation half-plane. Any arrangement of the components which is equivalent to the one shown can be used. Figure A4-I Figure A4-I shows the CIE angular system for specifying and measuring retro-reflective device and marking materials. The first axis is perpendicular to the plane containing the observation axis and the illumination axis. The second axis is perpendicular both to the first axis and to the reference axis. Figure A4-II 1: First Axis I: Illumination Axis α: Observation angle 2: Second Axis O: Observation Axis ß1, ß2: Entrance angles R: Reference Axis ε: Rotation angle P: Retro-reflective material Figure A4-II represents a Goniometer mechanism embodying the CIE angular system for specifying and measuring retro-reflective device and marking materials. All axes, angles, and directions of rotation are shown positive. Notes: (a) The principle fixed axis is the illumination axis; (b) The first axis is fixed perpendicular to the plane containing the observation and illumination axis; (c) The reference axis is fixed in the retro-reflective device and moveable with ß1 and ß2. Figure A4-III Figure A4-IV For the purpose of this Regulation, the following limits are set up: 10' 10' 80' Figure A4-V Elevation Symbols and units A = Area of the illuminating surface of the retro-reflective device (cm2) C = Centre of reference NC = Axis of reference Rr = Receiver, observer or measuring device Cr = Centre of receiver Ør = Diameter of receiver Rr if circular (cm) Se = Source of illumination Cs = Centre of source of illumination Øs = Diameter of source of illumination (cm) De = Distance from centre Cs to centre C (m) D’e = Distance from centre Cr to centre C (m) Note: In general, De and D’e are very nearly the same and under normal conditions of observation it may be assumed that De = D’e. D = Observation distance from and from beyond which the illuminating surface appears to be continuous  = Angle of divergence β = Illumination angle. With respect to the line CsC which is always considered to be horizontal, this angle is prefixed by the signs – (left), + (right), + (up) or – (down), according ...
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Description of Goniometer. A goniometer as defined in paragraph 2.3. of this Regulation, which can be used in making retro-reflection measurements in the CIE geometry is illustrated in Figure A4-II. In this illustration, the photometer head (O) is arbitrarily shown to be vertically above the source (I). The first axis is shown to be fixed and horizontal and is situated perpendicular to the observation half- plane. Any arrangement of the components which is equivalent to the one shown can be used. Part 2 - Description of the measurement geometry for measurement of the daytime colour and the luminance factor of retro- reflective material For testing the daytime colour and luminance factor of the material, illumination by CIE Standard Illuminant D65 (ISO 11664-2:2007(E)/CIE S 014-2/E:2006) using geometry (45a:0) shall be used. 1. Measurement of daytime Colour Measurements shall be done with a spectrophotometer in accordance with the provisions of Publication CIE 15:2004, Recommendations on Colorimetry - Second Edition, either illuminated poly-chromatically or with a monochromator providing stepwise the CIE Standard Illuminant D65 (ISO 11664-2:2007(E)/CIE S 014-2/E:2006) at an angle 45º to the normal and viewed along the normal (geometry 45/0). In the latter case, the stepwise resolution Δλ shall be not larger than 10 nm. Alternatively, similar simulation spectra are allowed, if verified that the colorimetric measuring procedure is of the same accuracy, meaning that the quality of the D65 simulation shall be assessed by the method described in ISO 23603:2005(E)/CIE S 012/E:2004. The spectral distribution of the Illuminant shall be in category BC (CIELAB) or better. The measurement area shall be at least minimum 4.0 cm². Micro-prismatic materials show the phenomenon of "flares" or "sparkles" (Note 1), which might influence the measured results unless special precautions as outlined above are taken. For this geometry CIE 15 recommends that: (a) The sampling aperture be irradiated uniformly from all directions between two circular cones with their axes normal to the sampling aperture and apices at the centre of the sampling aperture, the smaller of the cones having a half angle of 40° and the larger of 50°. (b) The receiver uniformly collects and evaluates all radiation reflected within a cone with its axis on the normal to the sampling aperture, apex at the centre of the sampling aperture, and a half angle of 5°. The annular geometry can be approximated by the use of a number of light sou...
Sample 1Sample 2
Description of Goniometer. A goniometer as defined in paragraph 2.13. to this Horizontal Reference Document, which can be used in making retro-reflection measurements in the CIE geometry is illustrated in Annex 1, figure 2. In this illustration, the photometer head (O) is arbitrarily shown to be vertically above the source (I). The first axis is shown to be fixed and horizontal and is situated perpendicular to the observation half-plane. Any arrangement of the components which is equivalent to the one shown can be used. 1: First Axis I: Illumination Axis α: Observation angle 2: Second Axis O: Observation Axis ß1, ß2: Entrance angles R: Reference Axis ε: Rotation angle The CIE angular system for specifying and measuring retro-reflective marking materials. The first axis is perpendicular to the plane containing the observation axis and the illumination axis. The second axis is perpendicular both to the first axis and to the reference axis. All axes, angles, and directions of rotation are shown positive. (a) The principle fixed axis is the illumination axis. (b) The first axis is fixed perpendicular to the plane containing the observation and illumination axis. (c) The reference axis is fixed in the retro-reflective material and moveable with ß1 and ß2. GONIOMETER MECHANISM EMBODYING THE CIE ANGULAR SYSTEM 1: First Axis I: Illumination Axis α: Observation angle 2: Second Axis O: Observation Axis ß1, ß2: Entrance angles R: Reference Axis ε: Rotation angle P: Retro-reflective material Representation of a Goniometer mechanism embodying the CIE angular system for specifying and measuring retro-reflective materials. All angles and directions of rotation are shown positive. These examples show some arrangements to aid the understanding of the provisions and are not intended to be design restrictive. 1. Illuminating surface 2. Axis of reference 3. Centre of reference 4. Angle of geometric visibility 5. Light-emitting surface 6. Apparent surface based on the illuminating surface 7a. Apparent surface based on the light-emitting surface according to paragraph 2.8. a) (with outer lens) 7b. Apparent surface based on the light-emitting surface according to paragraph 2.8. b) (without outer lens) 8. Direction of visibility IO Inner optical part LG Light guide L Outer lens R Reflector S Light source X Not part of this function F1 Function one F2 Function two Apparent surface based on light-emitting surface Screens; other positions of the screens are possible Illuminating surface Resulting illuminating...
Sample 1
Description of Goniometer. A goniometer as defined in paragraph 2.3. of this Regulation, which can be used in making retro-reflection measurements in the CIE geometry is illustrated in Figure A4-II. In this illustration, the photometer head (O) is arbitrarily shown to be vertically above the source (I). The first axis is shown to be fixed and horizontal and is situated perpendicular to the observation half-plane. Any arrangement of the components which is equivalent to the one shown can be used." Paragraph 1.1. amend to read: 1.1. The shape of the illuminating surfaces shall not be easily confused with a triangle at normal observation distances."
Sample 1

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